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Dr Byong-Guk Park


Telephone : +44.1223.44.29.14 (Direct)

                  +44.1223.44.29.00 (Secretary)

Email: bp286 (add domain name : "cam.ac.uk")



List of publications


Journal articles :






Conference proceedings :


  • J. H. Park, S. Ikeda, H. Yamamoto, H. D. Gan, K. Mizunuma, K. Miura, H. Hasegawa, J. Hayakawa, K. Ito, F. Matsukura, and H. Ohno, International Magnetics Conference 2009 (INTERMAG), p3476 (2009), Perpendicular Magnetic Tunnel Junctions with CoFe/Pd Multilayer Electrodes and an MgO Barrier

  • B. G. Park, T. Banerjee, B. C. Min, J. G. M. Sanderink, J. C. Lodder, and R. Jansen, INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference, p (2005), Probing spin-polarized tunneling at high bias and temperature with a magnetic tunnel transistor

  • W. C. Lim, B. G. Park, J. Y. Bae, and T. D. Lee, International Symposium on Magnetic Materials and Applications, p1696 (2004), Effects of free layer materials and thickness on TMR behaviour in magnetic tunnel junctions

  • B. G. Park, T. D. Lee, T. H. Lee, C. G. Kim, and C. O. Kim, 47th Annual Conference on Magnetism and Magnetic Materials, p6423 (2003), Magnetic tunnel junctions with Hf oxide and modified Hf oxide tunnel barriers

  • B. G. Park, and T. D. Lee, International Magnetics Conference (Intermag Europe 2002), p2706 (2002), Enhanced tunnel magnetoresistance by Hf-layer insertion in the AlOx tunnel barriers

  • B. G. Park, J. Y. Bae, and T. D. Lee, 46th Annual Conference on Magnetism and Magnetic Materials, p8789 (2002), Growth characteristics of Al oxide formed by ozone in magnetic tunnel junctions

  • B. G. Park, and T. D. Lee, Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference, p (2002), Enhanced tunnel magnetoresistance by Hf layer insertion in the tunnel barriers

  • B. Park, and T. D. Lee, International Conference on Magnetism, p926 (2001), A study on tunneling magnetoresistance in magnetic tunnel junctions oxidized by ozone

  • B. G. Park, and T. D. Lee, 1999 International Magnetics Conference (INTERMAG 99), p2919 (1999), Dependence of tunneling magnetoresistance on CoFe interfacial layer thickness in NiFe/Al2O3/NiFe tunnel junctions